This search combines search strings from the content search (i.e. "Full Text", "Author", "Title", "Abstract", or "Keywords") with "Article Type" and "Publication Date Range" using the AND operator.
Beilstein J. Nanotechnol. 2014, 5, 77–82, doi:10.3762/bjnano.5.7
Figure 1: XAS at the Ti-L2,3 edge measured for TiO2 films with thicknesses of 0.75 nm, 1.5 nm, 2.25 nm and 3 ...
Figure 2: XAS at O-K edge measured for TiO2 films with thicknesses of 0.75 nm, 1.5 nm, 2.25 nm and 3 nm. The ...
Figure 3: XAS difference spectra. The contribution of SiO2 to the XAS at the O-K edge was subtracted from the...
Figure 4: Detailed view of feature C. The spectra were normalized in order to distinguish line-shape changes.